X-RAY DIFFRACTOMETER (XRD)
Brand / Model: Malvern Panalytical / EMPYREAN (3rd Generation)
Description: X-ray Diffraction (XRD) is based on the characteristic diffraction of X-rays by crystalline phases according to their unique atomic arrangements. Each crystalline phase produces a specific diffraction pattern that serves as a fingerprint for phase identification. XRD is a non-destructive analytical technique and enables qualitative and quantitative analysis even with very small amounts of sample. The Malvern Panalytical EMPYREAN (3rd Generation) XRD system at our center is used for structural analysis of rocks, crystalline and amorphous materials, thin films, and polymers.
Working Principle: The core component of the XRD system is a high-precision goniometer. The X-ray tube (Cu-Kα) is mounted on the goniometer and designed to provide high resolution throughout its operational lifetime. The system supports both point-focus and line-focus measurements. Optical modules are used for both incident and diffracted X-rays and can be mounted at the PreFIX positions on the goniometer arms. A Bragg–Brentano optical module is used for incident X-rays, while a Cross Slit Collimator is used for diffracted X-rays. The intensity of diffracted X-rays is measured using a high-resolution solid-state PIXcel3D detector, which can operate in 0D (point), 1D (line), and 2D (area) modes, enabling observation of two-dimensional Debye rings. With the integrated temperature control unit, measurements can be performed at temperatures up to 1200 °C.
Instrument Features
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X-ray source: Cu-Kα
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High-precision goniometer
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PreFIX optical module system
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PIXcel3D multi-mode detector (0D / 1D / 2D)
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Point and line focus measurement capability
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High-temperature measurements up to 1200 °C
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Non-destructive analysis with minimal sample requirement
Application Areas
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Phase identification in powder, bulk, and thin film samples
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Quantitative phase analysis
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Crystallite size and lattice parameter determination
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Investigation of structural changes
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Preferred orientation (texture) analysis
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Determination of atomic positions
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2D mapping
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Texture and stress analysis
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Rietveld refinement analysis
Device Specialist:
1. Lecturer Dr. Hasan Köseoğlu
E-mail: hasan.koseoglu@iste.edu.tr
Phone: 0 (326) 310 2843
2. Lecturer Mustafa Göktan Aydın
E-mail: goktan.aydin@iste.edu.tr
Phone: 0 (326) 310 2842
