X-RAY DIFFRACTOMETER (XRD)
The X-Ray Diffraction method (XRD) is based on the principle that each crystal phase refracts X-rays in a characteristic pattern depending on its unique atomic arrangements. For each crystalline phase, these diffraction profiles identify that crystal, sort of like a fingerprint. The X-Ray Diffraction analysis method does not destroy the sample during analysis and enables analysis of even very small amounts of samples.
There is a Malvern Panalytical EMPYREAN (3rd Generation) brand/model XRD device operating in our center. Qualitative and quantitative examinations of rocks, crystalline and amorphous materials, thin films and polymers can be made with the X-Ray Diffraction device in our unit.
Analyzes that can be done with XRD:
- Phases in powder, solid and thin film samples,
- Amount of phases,
- Crystal size,
- Lattice parameters,
- Changes in structure,
- crystal orientation
- Atomic positions,
- 2D mapping
- Texture and stress analysis
- Rietveld analysis
Malvern Panalytical EMPYREAN (3. Nesil)
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The Empyrean cabinet, which is the working environment, has 2 main parts: the diffractometer housing and the electronics and support unit.
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Goniometer as the core of the diffractometer.
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The X-ray tube (Cu-Kα) is mounted on the goniometer in a tube body. The device is designed to provide high resolution throughout the life of the X-ray tube and allows both point and line focused studies.
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There are optical modules for incident and refracted X-rays. These modules can be mounted at PreFIX positions on the arms of the goniometer (Bragg-Brentano optical module for incident X-rays, Cross Slit Collimator for refracted X-rays).
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A sample holder in which a sample is placed so that its properties can be measured.
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It has a solid-state type three-dimensional pixel-based (pixcel3D) detector with high resolution power that measures the intensity of the X-ray refracted from the sample. The detector is used to observe 2D Debye rings as a point detector in 0D mode, a linear detector in 1D mode, and an area detector in 2D mode.
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Measurements are taken up to 1200°C with the temperature control unit of the system.
Other Technical Specifications
Device Specialist:
1. Specialist Dr. Hasan Köseoğlu
E-mail: hasan.koseoglu@iste.edu.tr
Phone: 0 (326) 613 56 00
Internal: 3153
2. Specialist Mustafa Göktan Aydın
E-mail: goktan.aydin@iste.edu.tr
Phone: 0 (326) 613 56 00
Internal: 3150
