Scanning Electron Microscope (SEM)
In Scanning Electron Microscopy, electrons removed from the electron source are dropped onto the sample with the help of collecting lenses in a column under vacuum, and the particles and x-rays resulting from the interaction of the electron beam with the atoms on the sample surface are detected, and information is obtained about the topography and chemical composition of the sample being examined.
While secondary electrons scattered from surface atoms provide information about the sample surface, backscattered electrons are used to detect elemental differences on the sample surface through the contrast difference between regions with different chemical compositions. Backscattered electrons also help determine the crystallographic structure of the sample by providing an electron backscatter diffraction (EBSD) image. The x-rays resulting from the interaction of the electron beam with the sample are collected by an EDS detector and used in Energy-Dispersive X-Ray Spectroscopy.
The Thermo Fisher Scientific Apreo S LoVac brand/model scanning electron microscope operating in our center has a Field Emission Electron Gun and has an image resolution of 1 nm at 1 kV. Detailed information about the microscope, which operates between 0.2 – 30 kV, is below.
Thermo Fisher Scientific Apreo S LoVac SEM
The most capable high-performance SEM
Apreo S's revolutionary composite lens design combines electrostatic and electromagnetic immersion technologies to provide unprecedented resolution and signal selection. This makes the Apreo S platform an excellent choice for working in nanoparticle, catalyst, powder and nanodevice research without compromising magnetic sample performance.
Apreo S benefits from unique in-lens backscatter detection, which provides excellent material contrast even in tilt situations, short working distances or sensitive samples. The newly introduced compound lens structure provides high contrast with energy filtering and charge filtering when imaging insulating samples. The optional low vacuum mode provides a maximum sample chamber pressure of 500 Pa, allowing imaging of even the most insulating materials.
All these options, including the combined final lens, provide flexibility in advanced detection and sample types.
The new Apreo S scanning electron microscope (SEM) delivers performance for a wide range of materials, including nanoparticles, metals, composites and coatings, offering better resolution, contrast and ease of use.
- The unique composite final lens technology delivers 1 nm resolution at 1 kV without the need for beam deceleration, even if the sample is tilted or topographic.
- The most useful backscatter detection – even at low voltage and beam currents, material contrast is always achieved, regardless of tilt, even in beam-sensitive samples.
- Unique detector flexibility – by combining information from different detector segments, more important contrast or signal intensity can be achieved.
Detectors
- Trinity Detection System (in-lens and in-column)
- T1 low in-lens detector
- T2 high in-lens detector
- T3 in-column detector
- Everhart-Thornley Secondary Electron detector (ETD)
- Backscattered Electron Detector (BSED) - Retractable under the lens
- Low Vacuum Detector (LVD)
- Pathfinder X-ray Microanalysis System
- Thermo Scientific UltraDry Energy Dispersive X-ray Spectroscopy Detector (EDS)
- Thermo Scientific Quasor II Electron Backscatter Diffraction Detector (EBSD)
- Nav-Cam+™ Chamber Mounted Camera
Device Specialist:
1. Specialist Dr. Hasan Köseoğlu
E-mail: hasan.koseoglu@iste.edu.tr
Phone: 0 (326) 613 56 00
Internal: 3153
2. Specialist Mustafa Göktan Aydın
E-mail: goktan.aydin@iste.edu.tr
Phone: 0 (326) 613 56 00
Internal: 3150
